2006-2010 [2009.02.17] Comparative study of self-heating effect on electron mobility in nano-scale strained silicon-on-insulator and strained silicon grown on relaxed SiGe-on-insulator n-metal-oxide-semiconductor field-effect transistors
2021.02.27 17:38
Seong-Je Kim, Tae-Hun Shim, Ki-Ryoung Choi and Jea-Gun Park
Comparative study of self-heating effect on electron mobility in nano-scale strained silicon-on-insulator and strained silicon grown on relaxed SiGe-on-insulator n-metal-oxide-semiconductor field-effect transistors