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167 [2007.11.04] Non-Prestonian Behavior of Ceria Slurry in Shallow Trench Isolation Chemical Mechanical Polishing (STI-CMP)
166 [2007.09.15] Impact of the top silicon thickness on phonon-limited electron mobility in (110)-oriented ultrathin-body silicon-on-insulator n-metal-oxide-semiconductor field-effect transistors file
165 [2007.08.06] Nanotopography Impact of Surfactant Concentration and Molecular Weight of Nano-ceria Slurry on Remaining Oxide Thickness Variation after Shallow Trench Isolation Chemical Mechanical Polishing
164 [2007.08.06] Effect of Alkaline Agent in Colloidal Silica Slurry for Polycrystalline Silicon Chemical Mechanical Polishing
163 [2007.07.14] Effects of the Size and the Concentration of the Abrasive in a Colloidal Silica (SiO2) Slurry with Added TMAH on Removal Selectivity of Polysilicon and Oxide Films in Polysilicon Chemical Mechanical Polishing
162 [2007.06.06] Dependence of Electrical Characteristics on Si Thickness and Ge Concentration for Unstrained Si Grown on Strained SiGe-on-Insulator n-Metal–Oxide–Semiconductor Field-Effect Transistor file
161 [2007.05.22] Influence of Crystalline Structure of Ceria on the Remaining Particles in the STI CMP
160 [2007.05.15] Effect of O2 Plasma Treatment on Hole-Injection Enhancement for Organic Light-Emitting Devices with Transparent Au:Al Anodes file
159 [2007.05.13] Dependency of Current Conduction Bi-stability on Middle Al Thickness in Organic Bistable Device with Al Nano-crystals Embedded in α-NPD
158 [2007.03.15] Effects of Abrasive Particle Size and Molecular Weight of poly(acrylic acid) in Ceria Slurry on Removal Selectivity of SiO2/Si3N4 films in Shallow Trench Isolation Chemical Mechanical Planarization
157 [2007.03.15] Effect of characteristics of nano-colloidal silica abrasives on wafer surface roughness for wafer touch polishing
156 [2007.02.15] Post-RTA Effect on the Electrical Characteristics of Nano-Scale Strained Si Grown on SiGe-on-Insulator n-MOSFET file
155 [2007.02.15] Characteristics of Dual Emission Using a Thin Semi-Transparent Au Cathode for Organic Light-Emitting Devices file
154 [2007.01.15] Dependency of electrical characteristics on Au nano-crystal size for non-volatile memory fabricated with Au nano-crystal embedded in PVK(poly(N-vinylcarbazole)) layer
153 [2006.12.26] O2 Plasma Treatment of Al Layer on Metal Anode to Improve the Performance of Organic Light-Emitting Devices file