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Jin-Hyon Lee, Young-Min Choi, Ungyu Paik and Jea-Gun Park

 

The effect of carboxymethyl cellulose swelling on the stability of natural graphite particulates in an aqueous medium for lithium ion battery anodes

 

J. Electroceramics 17 (2006) 657

번호 제목
168 [2007.12.06] Effect of Organic Amine in Colloidal Silica Slurry for Copper Chemical Mechanical Polishing
167 [2007.11.04] Non-Prestonian Behavior of Ceria Slurry in Shallow Trench Isolation Chemical Mechanical Polishing (STI-CMP)
166 [2007.09.15] Impact of the top silicon thickness on phonon-limited electron mobility in (110)-oriented ultrathin-body silicon-on-insulator n-metal-oxide-semiconductor field-effect transistors file
165 [2007.08.06] Nanotopography Impact of Surfactant Concentration and Molecular Weight of Nano-ceria Slurry on Remaining Oxide Thickness Variation after Shallow Trench Isolation Chemical Mechanical Polishing
164 [2007.08.06] Effect of Alkaline Agent in Colloidal Silica Slurry for Polycrystalline Silicon Chemical Mechanical Polishing
163 [2007.07.14] Effects of the Size and the Concentration of the Abrasive in a Colloidal Silica (SiO2) Slurry with Added TMAH on Removal Selectivity of Polysilicon and Oxide Films in Polysilicon Chemical Mechanical Polishing
162 [2007.06.06] Dependence of Electrical Characteristics on Si Thickness and Ge Concentration for Unstrained Si Grown on Strained SiGe-on-Insulator n-Metal–Oxide–Semiconductor Field-Effect Transistor file
161 [2007.05.22] Influence of Crystalline Structure of Ceria on the Remaining Particles in the STI CMP
160 [2007.05.15] Effect of O2 Plasma Treatment on Hole-Injection Enhancement for Organic Light-Emitting Devices with Transparent Au:Al Anodes file
159 [2007.05.13] Dependency of Current Conduction Bi-stability on Middle Al Thickness in Organic Bistable Device with Al Nano-crystals Embedded in α-NPD
158 [2007.03.15] Effects of Abrasive Particle Size and Molecular Weight of poly(acrylic acid) in Ceria Slurry on Removal Selectivity of SiO2/Si3N4 films in Shallow Trench Isolation Chemical Mechanical Planarization
157 [2007.03.15] Effect of characteristics of nano-colloidal silica abrasives on wafer surface roughness for wafer touch polishing
156 [2007.02.15] Post-RTA Effect on the Electrical Characteristics of Nano-Scale Strained Si Grown on SiGe-on-Insulator n-MOSFET file
155 [2007.02.15] Characteristics of Dual Emission Using a Thin Semi-Transparent Au Cathode for Organic Light-Emitting Devices file
154 [2007.01.15] Dependency of electrical characteristics on Au nano-crystal size for non-volatile memory fabricated with Au nano-crystal embedded in PVK(poly(N-vinylcarbazole)) layer