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ASMDDC
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STT-MRAM
Spin Neuron
3D ReRAM
ReRAM Based Synaptic Device
CMP Slurry
SiGe Based FinFET
CMOS Image Sensor
QD UV Camera
Thyristor based 1T-DRAM
IZGO FET
Display for Quantum-dots
Solar Cell with Quantum-dots
GaN Substrate
Sapphire Growth
Si Wafer Evaluation for Solar Cell
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[2022.05.15] 첨단 반도체 소재/소자 개발 연구소 스승의 날 행사
[210130] "한국 반도체, 기술 초격차로 중국 따돌리고 대만에 맞서야"
전체
Year
2016-2020
2011-2015
2006-2010
2001-2005
2021-
1996-2000
1990-1995
번호
제목
15
[1995.__.__] Observation of Structural, Electrical, and Chemical Nature on Multi-ring Wafer
14
[1995.__.__] Nature of D-defect in CZ Silicon : D-defect Dissolution and D-Defect Related T.D.D.B
13
[1995.__.__] Gate Oxide Integrity in DRAM Devices : The Influence of Substrate D-defects
12
[1995.__.__] Effect of H2 Annealing on Oxide Integrity Improvement
11
[1995.__.__] Defect Oxide Defect Detection by Cu-decoration
10
[1995.03.20] Effect of D-defects and Oxygen Precipitates on Oxide Integrity
9
[1994.__.__] Temperature Dependent Electron Beam Induced Current Studies of MOS Capacitor Structures
8
[1994.__.__] Structure and Morphology of "D-defects" in CZ Si
7
[1994.__.__] Correlation of Substrate D-defects in CZ Silicon with MOS Breakdown Site via MOS/EBIC, FIB, and TEM
6
[1994.__.__] Comparison of Oxide Breakdown Mechanisms Due to D-defects and Oxygen Precipitates
5
[1993.07.01] Effects of Metallic Impurities upon Thin Gate Oxide Integrity and Related Bulk Properties in CZ Si
4
[1993.07.01] Effects of D-Defects in CZ Silicon Upon Thin Gate Oxide Integrity
3
[1992.__.__] Effects of Silicon Ion Implantation upon Thin Gate Oxide Integrity
2
[1991.09.01] Effects of Oxygen Content of Starting Si Substrate and a a Pre-initial Oxidation Internal Gettering Treatment upon 256 K Dynamic Random Access Memory
1
[1991.09.01] Effects of Carbon and Oxygen Impurities in Czochralski Si upon Device Performance and Yield of 1 Mb Dynamic Random Access Memory