97 |
[2010.12.20] Micro Defect Size in Si Single Crystal Grown by Czochralski Method
|
96 |
[2010.12.15] Four-level Nonvolatile Small-molecule Memory-Cell Embedded with Fe Nanocrystals Surrounded with FeO and Fe2O3 Tunneling Barrier
|
95 |
[2010.09.24] Fabricated nonvolatile memory with Ag nano-crystals embedded in PVK
|
94 |
[2010.09.23] Potassium Permanganate as Oxidizer in Alkaline Slurry for Chemical Mechanical Planarization of Nitrogen-doped Polycrystalline Ge2Sb2Te5 Film
|
93 |
[2010.08.10] Titanium Oxide Thin Films Prepared by Plasma Enhanced Atomic Layer Deposition Using Remote Electron Cyclotron Resonance Plasma for Organic Devices Passivation
|
92 |
[2010.06.01] Device Performance and Polymer Layer Morphology in Polymer Bistable Device (PBD): The Control of Physicochemical Properties of Solvent
|
91 |
[2010.05.14] Effect of NiOx thin layer fabricated by oxygen-plasma treatment on polymer photovoltaic cell
|
90 |
[2010.04.27] Dependence of SOI Properties on Memory Characteristics in a Cap-less Memory Cell
|
89 |
[2010.04.23] Capacitor-less memory-cell fabricated on nanoscale unstrained Si layer on strained SiGe layer-on-insulator
|
88 |
[2010.04.20] Multiselectivity Chemical Mechanical Polishing for NAND Flash Memories beyond 32 nm
|
87 |
[2010.03.23] Optimal Channel Ion Implantation for High Memory Margin of Capacitor-Less Memory Cell Fabricated on Fully Depleted Silicon-on-Insulator
|
86 |
[2010.03.23] Effects of Bulk Microdefects and Metallic Impurities on p-n Junction Leakage Currents in Silicon
|
85 |
[2010.03.08] Role of Hydrogen Peroxide in Alkaline Slurry on the Polishing Rate of Polycrystalline Ge2Sb2Te5 Film in Chemical Mechanical Polishing
|
84 |
[2010.03.04] Effect of Hydroxyethyl Cellulose Concentration on Surface Qualities of Silicon Wafer after Touch Polishing Process
|
83 |
[2010.03.01] Guest Editorial
|
82 |
[2010.01.06] Effect of Organic Additive on Surface Roughness of Polycrystalline Silicon Film after Chemical Mechanical Polishing
|
81 |
[2009.12.10] Effect of Metal-Reflection and Surface-Roughness Properties on Power-Conversion Efficiency for Polymer Photovoltaic Cells
|
80 |
[2009.12.06] Nonvolatile Memory Characteristics of Small-molecule Memory Cells with Electron-transport and Hole-transport Bilayers
|
79 |
[2009.12.06] Effect of Interface Chemical Properties on Nonvolatile Memory Characteristics for Small-molecule Memory Cells Embedded with Ni Nanocrystals Surrounded by NiO
|
78 |
[2009.11.10] Increase in the Adsorption Density of Anionic Molecules on Ceria for Defect-Free STI CMP
|