2006-2010 [2008.04.18] Silicon thickness fluctuation scattering dependence of electron mobility in ultrathin body silicon-on-insulator n-metal-oxide-semiconductor field-effect transistors
2021.02.27 17:30
Yong-Seon Lee, Tae-Hun Shim, Sang-Dong Yoo and Jea-Gun Park
Silicon thickness fluctuation scattering dependence of electron mobility in ultrathin body silicon-on-insulator n-metal-oxide-semiconductor field-effect transistors