ASMDDC :: Papers

메뉴 건너뛰기

[200817] N-LAB 현판식 @ 한양대학교 FTC 1층 클린룸

[190524-25] 스승의 날 행사 @ 경기도 이천

[APR 24-26, 2019] SUMCO Workshop @ HYU (Seoul)

번호	제목
공지	Update 진행중
12	[1995.__.__] Defect Oxide Defect Detection by Cu-decoration
11	[1995.03.20] Effect of D-defects and Oxygen Precipitates on Oxide Integrity
10	[1994.__.__] Temperature Dependent Electron Beam Induced Current Studies of MOS Capacitor Structures
9	[1994.__.__] Structure and Morphology of "D-defects" in CZ Si
8	[1994.__.__] Correlation of Substrate D-defects in CZ Silicon with MOS Breakdown Site via MOS/EBIC, FIB, and TEM
7	[1994.__.__] Comparison of Oxide Breakdown Mechanisms Due to D-defects and Oxygen Precipitates
6	[1993.07.01] Effects of Metallic Impurities upon Thin Gate Oxide Integrity and Related Bulk Properties in CZ Si
5	[1993.07.01] Effects of D-Defects in CZ Silicon Upon Thin Gate Oxide Integrity
4	[1992.__.__] Effects of Silicon Ion Implantation upon Thin Gate Oxide Integrity
3	[1991.09.01] Effects of Oxygen Content of Starting Si Substrate and a a Pre-initial Oxidation Internal Gettering Treatment upon 256 K Dynamic Random Access Memory
2	[1991.09.01] Effects of Carbon and Oxygen Impurities in Czochralski Si upon Device Performance and Yield of 1 Mb Dynamic Random Access Memory
1	Update 진행중

첫 페이지 5 6 7 8 9 10 끝 페이지

쓰기

태그