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Kwang-Saik Kim, Byeong-Sam Moon, Hee-Bok Kang, Jea-Gun Park and Bo-Young Lee

 

Effects of Bulk Microdefects and Metallic Impurities on p-n Junction Leakage Currents in Silicon

 

Jpn. J. Appl. Phys. 49 (2010) 031301

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