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185 [2008.05.20] Fabrication and Characterization of Organic Light-Emitting Diodes using Transparent Single-Crystal-Silicon Membrane
184 [2008.05.20] Effect of Organic Amine in Colloidal Silica Slurry on Polishing-Rate Selectivity of Copper to Tantalum-nitride Film in Copper Chemical Mechanical Planarization
183 [2008.05.20] Effect of Alkaline Agent with Organic Additive in Colloidal Silica Slurry on Polishing Rate Selectivity of Polysilicon-to-SiO2 in Polysilicon CMP
182 [2008.05.13] Dependence of temperature and self-heating on electron mobility in ultrathin body silicon-on-insulator n -metal-oxide-semiconductor field-effect transistors file
181 [2008.04.18] Silicon thickness fluctuation scattering dependence of electron mobility in ultrathin body silicon-on-insulator n-metal-oxide-semiconductor field-effect transistors file
180 [2008.03.31] Characterization of Organic Light-Emitting Diode (OLED) with Dual Emission using Al:Au Cathode file
179 [2008.03.27] Current Conduction Mechanism for Non-volatile Memory Fabricated with Conductive Polymer Embedded Au Nanocrystals
178 [2008.03.26] Small Molecular Organic Nonvolatile Memory Fabricated with Ni Nanocrystals Embedded in Alq3
177 [2008.03.26] Process Optimization of Ni Nanocrystals Formation Using O2 Plasma Oxidation to Fabricate Low-molecular Organic Nonvolatile Memory
176 [2008.03.26] Effect of Au Nanocrystals Embedded in Conductive Polymer on Non-volatile Memory Window
175 [2008.03.26] Dependence on Organic Thickness of Electrical Characteristics Behavior in Low Molecular Organic Nonvolatile Memory
174 [2008.03.26] Current Conduction Mechanism for Low-molecular Organic Nonvolatile Memory
173 [2008.03.10] Effect of Physicochemical Properties of Solvents on Microstructure of Conducting Polymer Film for Non-Volatile Polymer Memory
172 [2008.03.07] Small Molecular Organic Nonvolatile Memory Cells Fabricated with in Situ O2 plasma Oxidation
171 [2008.01.31] Polysilicon CMP for NAND Flash Memory beyond 45nm
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